Wirtualne seminarium ACMiN: Electron microscopy (SEM/TEM) in microstructural studies of metallic and composite materials

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Akademickie Centrum Materiałów i Nanotechnologii AGH zaprasza na wirtualne seminarium, które odbędzie się 29 października 2020 r. o godz. 14.00.

Referat pt. Electron microscopy (SEM/TEM) in microstructural studies of metallic and composite materials wygłosi dr inż. Marta Gajewska (Akademickie Centrum Materiałów i Nanotechnologii AGH).

Link dla uczestników

Streszczenie

Electron microscopy is one of the most powerful tools for microstructural characterization of materials, as it allows to obtain detailed structural information not only at the micrometer, but also nanometer and even sub-nanometer scale. This talk will be focused on applications of different electron microscopy techniques, such as high resolution imaging (HRTEM), electron diffraction (SAED), energy dispersive X-ray spectroscopy (EDXS), etc. in investigations of different metallic and composite materials, aiming at understanding their microstructure-property relationships. Firstly, I would like to present microstructural studies of bulk materials and coatings, i.a. wear resistant in situ metal/ceramic composites, with an emphasis on application of FIB/SEM technique for specimen preparation. Secondly, I would like to present a few examples of investigations employing electron microscopy for characterization of metallic and composite nanomaterials. As the size and shape of nano-objects, as well as their composition, morphology, crystalline structure, surface features, etc., are often intrinsic to their function, therefore they must be taken under careful consideration in tailoring the material for the intended application.

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